2019遠(yuǎn)東論壇第四個(gè)主旨報(bào)告內(nèi)容介紹及報(bào)告人介紹

2019遠(yuǎn)東論壇（青島）大會6月25日開幕。本屆大會共安排兩場大會報(bào)告，共8個(gè)主旨報(bào)告。第一場在25日上午開幕式后，有3個(gè)主旨報(bào)告；第二場在6月27日上午，有5個(gè)主旨報(bào)告。下面我們對6月27日上午第二場大會報(bào)告的第一個(gè)主旨報(bào)告進(jìn)行著重介紹：

報(bào)告題目
現(xiàn)代測量技術(shù)體系架構(gòu)及發(fā)展動態(tài)
Architecture and Development Tendency of Modern Measurement Technology

報(bào)告人
年夫順 研究員
Nian Fushun
中電科儀器儀表有限公司電子測試技術(shù)重點(diǎn)實(shí)驗(yàn)室
China Electronics Technology Instruments Co., Ltd., Science and Technology on Electronic Test & Measurement Laboratory

報(bào)告內(nèi)容簡介
簡單介紹了現(xiàn)代測量儀器與計(jì)算機(jī)、控制、通信和人工智能的深度融合關(guān)系，提出了基于MC3I的現(xiàn)代測量儀器可重構(gòu)體系結(jié)構(gòu)。重點(diǎn)分析了寬帶測量與高速測量、時(shí)域測量與頻域測量、穩(wěn)態(tài)測量與瞬態(tài)測量、機(jī)內(nèi)測量與機(jī)外測量等測量技術(shù)領(lǐng)域的熱點(diǎn)問題及發(fā)展動態(tài)。分析了現(xiàn)代測量儀器的芯片化、綜合化和平臺化發(fā)展趨勢。指出了未來測量技術(shù)與測量儀器的發(fā)展方向，預(yù)測了未來發(fā)展方向重點(diǎn)，給出了未來測量技術(shù)發(fā)展意見和建議。
Firstly, the deeply correlative relationship between modern measurement instruments and computer & control, communication, artificial intelligence was briefly introduced. The reconstructable architecture of modern measurement technology based on MC3I was then proposed. The emphasis was put on the hot topics and development tendency in measurement field, including broadband/ high-speed measurement, time/ frequency-domain measurement, steady/ transient-statemeasurement, built-in/ external measurement. The designing idea trending for modern measurement instruments based on chips, comprehensive system and platform are fully analyzed. Finally, the development directions for future testing instruments and technology were discussed. The critical points were predicted and some comments &suggestions were shared.

報(bào)告人簡介
年夫順，中國電子科技集團(tuán)公司測試儀器首席科學(xué)家，中電科儀器儀表有限公司電子測試技術(shù)重點(diǎn)實(shí)驗(yàn)室主任，長期從事電子測試儀器科研開發(fā)與管理工作。主持微波毫米波與太赫茲電路設(shè)計(jì)制造技術(shù)研究，形成了以寬頻帶為特色的微波毫米波與太赫茲有源和無源部件產(chǎn)品體系，微波毫米波與太赫茲測試儀器的關(guān)鍵部件全部實(shí)現(xiàn)國產(chǎn)化；主持連續(xù)波、多端口、脈沖和非線性矢量網(wǎng)絡(luò)分析儀的開發(fā)研制，使我國微波毫米波與太赫茲矢量網(wǎng)絡(luò)分析儀成體系和成規(guī)模發(fā)展，測試頻率覆蓋了100kHz～750GHz；以矢量網(wǎng)絡(luò)分析儀為核心儀器，構(gòu)建了電磁材料、微波芯片、天線與雷達(dá)散射截面測試系統(tǒng)，解決了片上器件、片上天線、低旁瓣天線、大型相控陣天線、MIMO天線、隱身材料及隱身目標(biāo)等測試評估難題，拓展了矢量網(wǎng)絡(luò)分析儀的應(yīng)用空間。
Nian Fushun, the chief scientist in the field of measurement instrument in China Electronics Technology Group Cooperation (CETC), the director of Science and Technology on Electronic Test & Measurement Laboratory of China Electronics Technology Instruments Co., Ltd (CETI), has a long-term commitment on R&D and management for electronic measurement equipment. He has been leading the design and manufacture technique of microwave, mm-wave and THz circuits, including the full product line of passive and active devices and components. These achievements feature the wideband characteristics and made it possible that all these microwave and THz key parts are China-made independently. He also has been in charge of the CW, multi-port, pulse and non-linear vector network analyzer, which formed the vector network measurement product system in China. The measuring frequency can cover from 100 kHz to 750GHz. As the crucial instruments, Ceyear vector network analyzer has been widely used in many automatic test systems, such as electromagnetic material test, microwave chip test, antenna & radar scattering cross section test and so on. These solutions can solve the issues in evaluating the on-chip device, on-chip antenna, low sidelobe antenna, big phased array antenna, MIMO antenna, stealth material and stealth target, which further deepen and extend the application area.