Linear scan: is used to describe the scan format in which the active beam aperture is electronically moved across the length of a linear arrar probe,either at normal incidence or a fixed angle. This format is alternately known as an "E-scan" in certain ASME and IIW document.
線性掃查:用于描述激活聲束孔徑,在聲波垂直入射或以固定角度斜入射的情況下,以電子方式沿線性陣列探頭的長(zhǎng)度方向移動(dòng)的掃查方式。這個(gè)掃查方式在某些ASME和IIW的文獻(xiàn)中被稱(chēng)為“E-掃查”。